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Article

Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens

Idaho National Laboratory, Idaho Falls, ID 83415, USA
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Author to whom correspondence should be addressed.
Received: 10 June 2020 / Revised: 23 June 2020 / Accepted: 25 June 2020 / Published: 29 June 2020
(This article belongs to the Special Issue Neutron Imaging)
Digital camera-based neutron imaging systems consisting of a neutron scintillator screen optically coupled to a digital camera are the most common digital neutron imaging system used in the neutron imaging community and are available at any state-of-the-art imaging facility world-wide. Neutron scintillator screens are the integral component of these imaging system that directly interacts with the neutron beam and dictates the neutron capture efficiency and image quality limitations of the imaging system. This work describes a novel approach for testing neutron scintillators that provides a simple and efficient way to measure relative light yield and detection efficiency over a range of scintillator thicknesses using a single scintillator screen and only a few radiographs. Additionally, two methods for correlating the screen thickness to the measured data were implemented and compared. An example 6LiF:ZnS scintillator screen with nominal thicknesses ranging from 0–300 μm was used to demonstrate this approach. The multi-thickness screen and image and data processing methods are not exclusive to neutron scintillator screens but could be applied to X-ray imaging as well. This approach has the potential to benefit the entire radiographic imaging community by offering an efficient path forward for manufacturers to develop higher-performance scintillators and for imaging facilities and service providers to determine the optimal screen parameters for their particular beam and imaging system. View Full-Text
Keywords: neutron imaging; neutron radiography; digital imaging; scintillator screen; scintillator development; scintillator performance; detection efficiency neutron imaging; neutron radiography; digital imaging; scintillator screen; scintillator development; scintillator performance; detection efficiency
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MDPI and ACS Style

Chuirazzi, W.C.; Craft, A.E. Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens. J. Imaging 2020, 6, 56. https://0-doi-org.brum.beds.ac.uk/10.3390/jimaging6070056

AMA Style

Chuirazzi WC, Craft AE. Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens. Journal of Imaging. 2020; 6(7):56. https://0-doi-org.brum.beds.ac.uk/10.3390/jimaging6070056

Chicago/Turabian Style

Chuirazzi, William C., and Aaron E. Craft 2020. "Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens" Journal of Imaging 6, no. 7: 56. https://0-doi-org.brum.beds.ac.uk/10.3390/jimaging6070056

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