Coherent Interactions between Electrons and Light

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".

Deadline for manuscript submissions: closed (21 September 2021) | Viewed by 3184

Special Issue Editor


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Guest Editor
Department of Applied Physics, Eindhoven University of Technology, PO Box 513, 5600 MB Eindhoven, The Netherlands
Interests: quantum physics in materials science; electron microscopy; coherence and quantum technology

Special Issue Information

Dear Colleagues,

In the past few years the research area involving the intricate interplay between light and free electrons has developed into an exciting new field: free electron quantum optics. Harnessing the weak interaction between free electrons and light requires either very strong electromagnetic fields or the close vicinity of nanostructures, which has only become possible with recent developments in laser and electron beam technology.

Electron beams now make it possible to generate, probe and control light at length scales far below the diffraction limit, enabling fundamental studies of nanophotonics. Photon-induced near-field electron microscopy has shown great potential for visualizing dynamic phenomena such as plasmonics with very high spatial and temporal resolution. Vice versa, the near fields of optically excited plasmon polaritons in nanostructures offer new ways to manipulate and shape electron beams, ultimately enabling aberration-free electron imaging. Strong laser fields can be employed to coherently manipulate the electron wave function in free space by the ponderomotive force for realizing, for example, matter-free Zernike electron phase plates and coherent electron beam splitters. These and other methods for electron wave manipulation offer the intriguing prospect of interaction-free electron microscopy: the “quantum electron microscope”. Finally, the combination of strong laser fields and very precisely tailored 3D nanostructures opens the way to high-gradient dielectric laser acceleration: a particle accelerator on a chip.

The burgeoning field of free electron quantum optics has already generated many fundamental insights and important applications. The latest developments in this exciting new field will be shared in this special issue. We invite researchers and investigators to contribute their original research or review articles to this special issue.

Prof. Dr. Jom Luiten
Guest Editor

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Keywords

  • free electron quantum optics
  • cathodoluminescence imaging spectroscopy
  • nanophotonics
  • photon-induced near-field electron microscopy
  • kapitza-dirac effect
  • ponderomotive phase plate
  • optical electron beam shaping
  • ultrafast electron microscopy
  • quantum electron microscopy
  • quantum degenerate electron beams
  • dielectric laser acceleration
  • particle accelerator on-a-chip

Published Papers (1 paper)

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Research

18 pages, 4909 KiB  
Article
Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope
by Daen Jannis, Knut Müller-Caspary, Armand Béché and Jo Verbeeck
Appl. Sci. 2021, 11(19), 9058; https://0-doi-org.brum.beds.ac.uk/10.3390/app11199058 - 28 Sep 2021
Cited by 10 | Viewed by 2841
Abstract
Recent advances in the development of electron and X-ray detectors have opened up the possibility to detect single events from which its time of arrival can be determined with nanosecond resolution. This allows observing time correlations between electrons and X-rays in the transmission [...] Read more.
Recent advances in the development of electron and X-ray detectors have opened up the possibility to detect single events from which its time of arrival can be determined with nanosecond resolution. This allows observing time correlations between electrons and X-rays in the transmission electron microscope. In this work, a novel setup is described which measures individual events using a silicon drift detector and digital pulse processor for the X-rays and a Timepix3 detector for the electrons. This setup enables recording time correlation between both event streams while at the same time preserving the complete conventional electron energy loss (EELS) and energy dispersive X-ray (EDX) signal. We show that the added coincidence information improves the sensitivity for detecting trace elements in a matrix as compared to conventional EELS and EDX. Furthermore, the method allows the determination of the collection efficiencies without the use of a reference sample and can subtract the background signal for EELS and EDX without any prior knowledge of the background shape and without pre-edge fitting region. We discuss limitations in time resolution arising due to specificities of the silicon drift detector and discuss ways to further improve this aspect. Full article
(This article belongs to the Special Issue Coherent Interactions between Electrons and Light)
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