Nanotechnology: Techniques and Instrumentations for Modeling and Characterization Data, Volume II
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Nanotechnology and Applied Nanosciences".
Deadline for manuscript submissions: closed (31 January 2022) | Viewed by 245
Special Issue Editor
Interests: RF nanotechnology; microwave/MM-wave radar; sensing techniques and systems
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Accurate knowledge of micro- and nanoscale effects leading to unique chemical/electrical/optical/mechanical properties of materials is key for the development and quality control of innovative nano-enabled products. Therefore, precise and quantitative characterization techniques of the nanostructure of nanomaterials, nanosystems, and nanodevices at the nanometer scale using advanced instrumentations and novel techniques have become a necessity. Further, various numerical modeling strategies have been developed to provide a new clarity to comprehend the structure and properties of nanomaterials.
The aim of this issue is to offer an opportunity to global in-the-field scholars to share novel approaches, techniques, and instrumentations for the modeling and characterization of nanomaterials at the nanoscale.
Specifically, topics of interest for this Special Issue include (but are not limited to):
- State-of-the-art measurement techniques and instruments at the micro- to nanoscale level;
- Methodologies for the quantitative characterization (AFM, STM, SEM, TEM, mass spectrometry, etc.);
- Standards for nanometer-scale characterization;
- Precision instrumentation design and theory;
- Reference materials, measurement standards, etc.;
- New and emerging measurement and analysis technologies;
- New developments in modeling and simulations at the nanoscale.
We cordially invite you to contribute to this Special Issue. The article may be either original research or reviews. We also encourage authors to send a short abstract or tentative title to us or the Managing Editor of this Special Issue in advance ([email protected]) for a brief check.
Prof. Dr. Kamel Haddadi
Guest Editor
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
