Advanced Materials Insights: An Electron Microscopy Approach
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".
Deadline for manuscript submissions: closed (10 July 2022) | Viewed by 2070
Special Issue Editor
Interests: electron microscopy; micromagnetic; crystallography; tomography; microcontrollers
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Electron Microscopy (EM) is regarded as a standard investigation technique in materials science. The need for exhaustive scientific information with good spatial localization (down to Angstrom scale) is transforming traditional EM into a dynamic environment accommodating techniques for morphological, chemical and structural characterizations. For example, state of the art transmission EM experiments allow material characterization at the atomic scale resolution in a controlled environment (vacuum, gas, liquid), under external excitation (heat, current, pressure). Moreover, most of the EM related techniques are able to also provide 3D information regarding the investigated material.
This Special Issue aims to provide a selection of contributions which reflect the advancements in the electron microscopy field.
The following topics are encouraged:
- electron tomography;
- novel methods for EM data acquisition and processing;
- in situ EM studies (gas, liquid);
- EM study of materials under external excitation (temperature, electrical currents);
- sample preparation by focused ion beam;
- rotation electron diffraction;
- crystallographic mapping (phases, orientations);
- strain mapping in thin films.
Dr. Andrei Cristian Kuncser
Guest Editor
Manuscript Submission Information
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Keywords
- electron tomography
- in situ
- sample preparation
- rotation electron diffraction
- crystallographic mappings
