materials-logo

Journal Browser

Journal Browser

Reliability and Failure Analysis of High Density Electronic Circuit Modules

A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Electronic Materials".

Deadline for manuscript submissions: closed (10 May 2022) | Viewed by 2473

Special Issue Editor


E-Mail Website
Guest Editor
Department of Electronics Technology, Budapest University of Technology and Economics, Budapest, Hungary
Interests: electronic failures; failure analysis; electrochemical migration; dendritic growth; whisker growth; lifetime predictions; reliability

Special Issue Information

Dear Colleagues,

Reliability is becoming a key issue in nowadays’ electronic systems. With their smartness, circuit modules are becoming more and more complex, device sizes are in the range of nanometer size and their interconnection systems have to be realized with high density having small size lines and spaces.  With size reduction, the failure possibilities became higher since a large number of environmentally driven material processes (corrosion, electrochemical migration, intermetallic formation, whisker growth) may result in failures. With the development of IoT, M2M (machine to machine communication in manufacturing lines), self-driving autonomous cars and vehicles, the continuous human control over the electronic modules will slowly be lost and their reliable operation must be realized by themselves. Thus their long term reliable operation is essential in such environments.

In a large number of applications, electronic modules operate in harsh environmental conditions, so the long-term behaviour of the applied materials is also critical. Failure analysis became an important area in investigating root causes of circuit failures coming from the field – NFF (No Fault Found) type solutions are not allowed any more. There is a strong need to designate the failure mechanisms based on multidisciplinary investigation and modelling in order to provide information for material design aspects.

This Special Issue is dedicated to disseminating the recent advancements and latest results in this rapidly evolving interdisciplinary research field. We invite colleagues to contribute to this Special Issue in the aforementioned topics and keywords with full papers, short communications, and reviews. The Special Issue focuses on electronic reliability and failure analysis, but other related topics are also welcome! 

Prof. Dr. Gabor Harsanyi
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • electronic failures
  • failure analysis
  • electrochemical migration
  • dendritic growth
  • whisker growth
  • corrosion
  • intermetallic formation
  • electro-migration
  • a acelerated lifetime investigations
  • reliability predictions

Published Papers (1 paper)

Order results
Result details
Select all
Export citation of selected articles as:

Research

10 pages, 7676 KiB  
Article
On the Electrochemical Migration Mechanism of Gold in Electronics—Less Reliable Than Expected?
by Bálint Medgyes, Ali Gharaibeh, Dániel Rigler and Gábor Harsányi
Materials 2021, 14(18), 5237; https://0-doi-org.brum.beds.ac.uk/10.3390/ma14185237 - 12 Sep 2021
Cited by 7 | Viewed by 2170
Abstract
Electrochemical migration (ECM) forming dendritic short circuits is a major reliability limiting factor in microcircuits. Gold, which is a noble metal, has been regarded as a metallization that can withstand corrosion and also ECM, therefore its application in high-reliability metallization and surface finishing [...] Read more.
Electrochemical migration (ECM) forming dendritic short circuits is a major reliability limiting factor in microcircuits. Gold, which is a noble metal, has been regarded as a metallization that can withstand corrosion and also ECM, therefore its application in high-reliability metallization and surface finishing systems became widespread although it has a relatively high and fluctuating price. Gold electrochemical short circuits have been found only in the case of halogen (e.g., chloride containing) contaminants that can initiate the anodic dissolution of gold via complex ion formation. The experimental results of the study demonstrate that gold can form dendritic shorts even without the presence of halogen contaminants, therefore the direct anodic dissolution of gold must also be supposed. This could also be a serious reliability influencing factor even when applying gold metallization systems and must be taken into consideration. The theoretical background of the classical (contaminant-free) model of gold is also discussed in the paper. Full article
Show Figures

Figure 1

Back to TopTop