Progress of Semiconductor Nanomaterials: From Material Synthesis to Functional Devices

A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Nanophotonics Materials and Devices".

Deadline for manuscript submissions: closed (31 March 2022) | Viewed by 4508

Special Issue Editor


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Guest Editor
Dto. de Ciencia de los Materiales e Ing. Metalúrgica y Qca. Inorg., IMEYMAT, Universidad de Cádiz, 11510 Puerto Real, Spain
Interests: electron microscopy; (S)TEM, semiconductors; opto-electronics; nanostructures; polymer composites

Special Issue Information

Dear Colleagues,

The current state-of-art of photonics allows for tuning the opto-electronic properties of the materials, rendering high performance systems intended for many technological advances. Within this context, semiconductor nanomaterials play nowadays a chief role in countless (photo/opto-)electronic devices and applications, whose properties are tightly linked to their microstructure. Thus, the design of customized functionalities relies on playing with different combinations of materials (including alloying), their morphology and environment (size, shape, relative orientation, etc.), attainable through optimized synthesis and processing strategies.

This Special Issue focusses on new advances achieved in semiconductor materials. The research topics cover semiconductor synthesis and (micro/nano-)processing, characterization, applications and devices, with special interest on complex nano-architectures, novel material systems, new/improved synthesis and processing procedures, high-resolution characterization techniques, etc.

Dr. María De La Mata
Guest Editor

Manuscript Submission Information

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Keywords

  • Semiconductor Nanostructures
  • Opto-electronics
  • High Spatial and Spectral Resolution Characterization
  • Energy harvesting
  • Nanostructured optical devices

Published Papers (1 paper)

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Review

20 pages, 3630 KiB  
Review
STEM Tools for Semiconductor Characterization: Beyond High-Resolution Imaging
by María de la Mata and Sergio I. Molina
Nanomaterials 2022, 12(3), 337; https://0-doi-org.brum.beds.ac.uk/10.3390/nano12030337 - 21 Jan 2022
Cited by 7 | Viewed by 3943
Abstract
The smart engineering of novel semiconductor devices relies on the development of optimized functional materials suitable for the design of improved systems with advanced capabilities aside from better efficiencies. Thereby, the characterization of these materials at the highest level attainable is crucial for [...] Read more.
The smart engineering of novel semiconductor devices relies on the development of optimized functional materials suitable for the design of improved systems with advanced capabilities aside from better efficiencies. Thereby, the characterization of these materials at the highest level attainable is crucial for leading a proper understanding of their working principle. Due to the striking effect of atomic features on the behavior of semiconductor quantum- and nanostructures, scanning transmission electron microscopy (STEM) tools have been broadly employed for their characterization. Indeed, STEM provides a manifold characterization tool achieving insights on, not only the atomic structure and chemical composition of the analyzed materials, but also probing internal electric fields, plasmonic oscillations, light emission, band gap determination, electric field measurements, and many other properties. The emergence of new detectors and novel instrumental designs allowing the simultaneous collection of several signals render the perfect playground for the development of highly customized experiments specifically designed for the required analyses. This paper presents some of the most useful STEM techniques and several strategies and methodologies applied to address the specific analysis on semiconductors. STEM imaging, spectroscopies, 4D-STEM (in particular DPC), and in situ STEM are summarized, showing their potential use for the characterization of semiconductor nanostructured materials through recent reported studies. Full article
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