Special Issue "Surface Analysis of Materials With Charged-Particle Beams"

A special issue of Quantum Beam Science (ISSN 2412-382X).

Deadline for manuscript submissions: closed (31 December 2019).

Special Issue Editors

Dr. Kouichi Hirata
E-Mail
Guest Editor
National Institute of Advanced Industrial Science and Technology (AIST), Japan
Dr. Kazumasa Narumi
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Guest Editor
Department of Advanced Radiation Technology Takasaki Advanced Radiation Research Institute Quantum Beam Science Research Directorate (QuBS) National Institutes for Quantum and Radiological Science and Technology (QST)
Interests: Interactions of energetic ions with solids; energy-loss processes of molecular/cluster ions in solids; secondary-electron emissions; sputtering; secondary-ion emissions; radiation damages; ion-beam analyses of materials; ion-beam modification of materials

Special Issue Information

Dear Colleagues,

Surface analysis using charged-particle beams has been playing an important role in various research fields, especially materials science and bioscience. Information on atomic composition and structure, defects, chemical structure, etc. can be obtained with the measurement of energy and/or yield of particles and radiation that emerge from a material irradiated with charged particles, i.e., ions, electrons, positrons, muons, etc. Its importance is still increasing, so that relevant techniques are also being developed from the viewpoint of higher resolution, higher sensitivity, advanced measurement, etc.; for example, in-air analysis using charged-particle beams, which has been developed recently, enables us to characterize biomaterials under wet conditions. In addition, novel beams, such as muon and cluster-ion beams, are increasingly applied to high-sensitivity and high-resolution surface analysis.

Reviews or articles on surface analysis with newly developed methods, modified techniques using charged-particle beams or their applications are the focus of this Special Issue. The issue will include subject matter concerning, but not limited to, the following keywords:

  • High-resolution depth profiling
  • High-sensitivity measurement
  • In-air analysis
  • Elemental-distribution imaging
  • RBS
  • ERDA
  • SIMS
  • PIXE
  • NRA
  • Applications using materials science, surface physics, surface chemistry, bioscience, drug discovery, geophysics, astrophysics, etc.

Dr. Kouichi Hirata
Dr. Kazumasa Narumi
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Quantum Beam Science is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • Ion beams
  • Electron/positron beams
  • Muon beams
  • High-resolution/sensitivity measurement
  • In-air analysis
  • Elemental-distribution imaging
  • Materials science
  • Surface physics and chemistry
  • Bioscience
  • Geophysics and/or astrophysics

Published Papers (2 papers)

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Research

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Article
Large Molecular Cluster Formation from Liquid Materials and Its Application to ToF-SIMS
Quantum Beam Sci. 2021, 5(2), 10; https://0-doi-org.brum.beds.ac.uk/10.3390/qubs5020010 - 29 Apr 2021
Viewed by 566
Abstract
Since molecular cluster ion beams are expected to have various chemical effects, they are promising candidates for improving the secondary ion yield of Tof-SIMS. However, in order to clarify the effect and its mechanism, it is necessary to generate molecular cluster ion beams [...] Read more.
Since molecular cluster ion beams are expected to have various chemical effects, they are promising candidates for improving the secondary ion yield of Tof-SIMS. However, in order to clarify the effect and its mechanism, it is necessary to generate molecular cluster ion beams with various chemical properties and systematically examine it. In this study, we have established a method to stably form various molecular cluster ion beams from relatively small amounts of liquid materials for a long time by the bubbling method. Furthermore, we applied the cluster ion beams of water, methanol, methane, and benzene to the primary beam of SIMS and compared the molecular ion yields of aspartic acid. The effect of enhancing the yields of [M+H]+ ion of aspartic acid was found to be the largest for the water cluster and small for the methane and benzene clusters. These results indicate that the chemical effect contributes to the desorption/ionization process of organic molecules by the molecular cluster ion beam. Full article
(This article belongs to the Special Issue Surface Analysis of Materials With Charged-Particle Beams)
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Review

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Review
Time-Of-Flight ERDA for Depth Profiling of Light Elements
Quantum Beam Sci. 2020, 4(4), 40; https://0-doi-org.brum.beds.ac.uk/10.3390/qubs4040040 - 18 Nov 2020
Viewed by 959
Abstract
The time-of-flight elastic recoil detection analysis (TOF-ERDA) method is one of the ion beam analysis methods that is capable of analyzing light elements in a sample with excellent depth resolution. In this method, simultaneous measurements of recoil ion energy and time of flight [...] Read more.
The time-of-flight elastic recoil detection analysis (TOF-ERDA) method is one of the ion beam analysis methods that is capable of analyzing light elements in a sample with excellent depth resolution. In this method, simultaneous measurements of recoil ion energy and time of flight are performed, and ion mass is evaluated. The energy of recoil ions is calculated from TOF, which gives better energy resolution than conventional Silicon semiconductor detectors (SSDs). TOF-ERDA is expected to be particularly applicable for the analysis of light elements in thin films. In this review, the principle of TOF-ERDA measurement and details of the measurement equipment along with the performance of the instrumentation, including depth resolution and measurement sensitivity, are described. Examples of TOF-ERDA analysis are presented with a focus on the results obtained from the measurement system developed by the author. Full article
(This article belongs to the Special Issue Surface Analysis of Materials With Charged-Particle Beams)
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