Dear Colleagues,

The recent advancements in artificial intelligence (AI) have demonstrated innovative and powerful capabilities in extracting information from datasets. Equally, AI has been applied to control and tune hardware, resulting in complete new smart instruments or subsystems. The use of this AI technology on instruments leads to new applications and instruments with enhanced properties. We invite authors to submit their work on the development of algorithms to improve the current state-of-the-art remote sensing technology, leading to optimal measurement strategies and enabling significant accuracy improvements in the retrievals of geophysical parameters.

Applying AI to instruments has the utmost potential to enable breakthrough technology. Instruments can gain autonomy, maximize their life expectancy or battery, optimize measurement trajectories, develop synergic collaboration with other instruments, and in summary maximize the science return from such instruments. On the other hand, improvements can be more modest but equally significant such as tuning or improving the measurement frequency and bandwidth, integration time, and/or measurement time, among others.

We encourage the submission of works related to AI-based technological advancements. Topics considered for this Special Issue should, therefore, emphasize the use of AI applied to technological assets that lead to better observations and enhanced retrievals. Both theoretical and practical studies are encouraged. Topics suggested include, but are not limited to the following:

• Use of AI in instruments for remote sensing;
• Use of AI in autonomy for remote sensing applications;
• Use of AI to develop synergic measurements with multiple instruments;
• Use of AI for choosing better measurement strategies and autonomous measurements;
• Use of AI in active and passive remote sensing instruments;
• Use of AI in optical sensors;
• Use of AI for instrument calibration;
• Use of AI for retrieval enhancements through the use of smart technology

Dr. Xavier Bosch-Lluis
Dr. Mehmet Ogut
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Remote Sensing is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2700 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

• Artificial intelligence
• Deep learning
• Smart technology
• Calibration
• Measurement strategy
• Radiometer
• Radar
• Optical sensor
• Enhanced retrievals
• Innovative concepts