Symmetry/Asymmetry in 2D Materials

A special issue of Symmetry (ISSN 2073-8994). This special issue belongs to the section "Engineering and Materials".

Deadline for manuscript submissions: closed (31 January 2024) | Viewed by 2844

Special Issue Editors

Graduate Institute of Opto-Mechatronics, National Chung Cheng University, 168 University Rd., Min-Hsiung, Chia-Yi 62102, Taiwan
Interests: biomedical science and engineering; biomedical sensors and images; hyperspectral imaging; optoelectronic semiconductor materials and devices; artificial intelligence
Special Issues, Collections and Topics in MDPI journals
1. Nikolaev Institute of Inorganic Chemistry, Siberian Branch of Russian Academy of Sciences, 630090 Novosibirsk, Russia
2. Department of Natural Sciences, Novosibirsk State University, 1, Pirogova Str., 630090 Novosibirsk, Russia
Interests: molybdenum disulfide; rhenium sulfide; Van Der Waals

Special Issue Information

Dear Colleagues,

The most frequently observed material among all of the two-dimensional (2D) transition metal chalcogenides for the next generation of electronic and optoelectronic components is molybdenum disulfide. Materials related to nanometer-scale electronic and optoelectronic components, such as the field effect transistor, prospective memory component, light-emitting diode, and sensors, have been produced due to the excellent spin-valley coupling and both the flexural and optoelectronic properties of 2D materials. However, the development of high-performance and large-area characterization techniques has been a major obstacle to the basic and commercial applications of 2D nanostructures. In current optical film measurements, the atomic force microscope (AFM) has various disadvantages, such as a relatively limited scan range and being time consuming; thus, it is unsuitable for quick measurements for large areas. Raman spectroscopy (Raman) is usually only capable of local characterization within one spot, which results in a limited measurement rate; hence, it is unsuitable for large-area analyses. Transmission electron microscopy (TEM) and scanning tunneling microscopy can be characterized at a high spatial resolution of up to the atomic scale. However, both techniques have the disadvantages of low throughput and complex sample preparation. The use of machine learning in image or visual recognition, compared with the abovementioned techniques, is a mature application field. The integration of machine learning (SVM, KNN, BGMM-DP, and K-means) with optical microscopes has only begun in recent years. Thus, artificial intelligence has great potential in the recognition of microscopic images, especially nanostructures. In this Special Issue, we welcome experts and scholars to submit relevant articles. The research topics include the use of material analysis, theoretical analysis, artificial intelligence, and optical methods for the study of two-dimensional materials.

Prof. Dr. Hsiang-Chen Wang
Guest Editor

Dr. Sofya B. Artemkina
Co-Guest Editor

Manuscript Submission Information

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Keywords

  • 2D materials
  • symmetry/asymmetry
  • thin film
  • artificial intelligence
  • large-area quick measurements

Published Papers (2 papers)

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Research

13 pages, 3286 KiB  
Article
Temperature-Dependent Phase Variations in Van Der Waals CdPS3 Revealed by Raman Spectroscopy
by Sharidya Rahman, Hieu Ngyuen, Daniel Macdonald and Yuerui Lu
Symmetry 2024, 16(2), 140; https://0-doi-org.brum.beds.ac.uk/10.3390/sym16020140 - 24 Jan 2024
Viewed by 758
Abstract
In addition to graphene, the transition metal dichalcogenides, black phosphorus and multiple other layered materials have undergone immense investigations. Among them, metal thiophosphates (MPSx) have emerged as a promising material for various applications. While several layered metal thiophosphates with general-formula MPS [...] Read more.
In addition to graphene, the transition metal dichalcogenides, black phosphorus and multiple other layered materials have undergone immense investigations. Among them, metal thiophosphates (MPSx) have emerged as a promising material for various applications. While several layered metal thiophosphates with general-formula MPSx have been scrutinized extensively, van der Waals (vdW) CdPS3 has been overlooked in the literature. Here we report on the extensive Raman scattering of layered CdPS3, showing structural phase transition at a low temperature. The emergence of multiple new peaks at low frequency and a significant shift in peak position with temperature implied a probable change in crystal symmetry from trigonal D3d to triclinic Ci below the phase transition temperature, TK~180 K. In addition, we also showed a p-type performance of CdPS3 FET fabricated using Au electrodes. This work adds CdPS3 to the list of potential layered materials for energy application. Full article
(This article belongs to the Special Issue Symmetry/Asymmetry in 2D Materials)
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14 pages, 4593 KiB  
Article
2d, or Not 2d: An Almost Perfect Mock of Symmetry
by Vladislav Komarov, Ruslan Galiev and Sofya Artemkina
Symmetry 2023, 15(2), 508; https://0-doi-org.brum.beds.ac.uk/10.3390/sym15020508 - 14 Feb 2023
Viewed by 1199
Abstract
The paper is related to an interesting case of revision of X-ray crystal structure with a lack of experimental data. Complexes V4OSe8I6·X (X = I2 or 3,5-dimethylpyrazole) with O-centered complex molecules [V4O(μ-Se2) [...] Read more.
The paper is related to an interesting case of revision of X-ray crystal structure with a lack of experimental data. Complexes V4OSe8I6·X (X = I2 or 3,5-dimethylpyrazole) with O-centered complex molecules [V4O(μ-Se2)4I4(μ-I)2] were synthesized in our group. In the further search for new relative compounds in the V-Se-I-O system, we obtained several crystals with different structures, including “V4OSe6I3”, with incredibly complicated connectivity of {V4O(Se2)4I6} units bridged via both diselenide and iodide ligands. Due to the absence of phase-pure products and the possible instability of some of the phases under ambient conditions, we were mainly guided by the single-crystal X-ray diffraction data. However, seeing a very complex coordination mode in the “V4OSe6I3” structure, we have carefully analyzed the structure from the positions of symmetry and chemical synthesis in this system. The “new structure” was recognized as the complex superposition of the structure of another compound with composition “V4OSe6I10” just found in the same experiment. We outlined the course of observations, reasoning and solutions to the symmetry false estimation problem, which we believe to be of interest to readers dealing with X-ray diffraction analysis. Full article
(This article belongs to the Special Issue Symmetry/Asymmetry in 2D Materials)
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