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Journal: Micromachines, 2024
Volume: 15
Number: 424

Article: Leakage and Thermal Reliability Optimization of Stacked Nanosheet Field-Effect Transistors with SiC Layers
Authors: by Cong Li, Yali Shao, Fengyu Kuang, Fang Liu, Yunqi Wang, Xiaoming Li and Yiqi Zhuang
Link: https://0-www-mdpi-com.brum.beds.ac.uk/2072-666X/15/4/424

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