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Article

Extracting the Infrared Permittivity of SiO2 Substrates Locally by Near-Field Imaging of Phonon Polaritons in a van der Waals Crystal

1
Department of Physics, University of Oviedo, 33006 Oviedo, Spain
2
Center of Research on Nanomaterials and Nanotechnology, CINN (CSIC-Universidad de Oviedo), 33940 El Entrego, Spain
3
Institute of Science and Technology Austria, 3400 Klosterneuburg, Austria
4
Donostia International Physics Center (DIPC), 20018 Donostia-San Sebastián, Spain
5
IKERBASQUE, Basque Foundation for Science, 48009 Bilbao, Spain
*
Authors to whom correspondence should be addressed.
These authors contributed equally to this work.
Received: 16 December 2020 / Revised: 28 December 2020 / Accepted: 2 January 2021 / Published: 7 January 2021
(This article belongs to the Special Issue 2D Materials and Their Heterostructures and Superlattices)
Layered materials in which individual atomic layers are bonded by weak van der Waals forces (vdW materials) constitute one of the most prominent platforms for materials research. Particularly, polar vdW crystals, such as hexagonal boron nitride (h-BN), alpha-molybdenum trioxide (α-MoO3) or alpha-vanadium pentoxide (α-V2O5), have received significant attention in nano-optics, since they support phonon polaritons (PhPs)―light coupled to lattice vibrations― with strong electromagnetic confinement and low optical losses. Recently, correlative far- and near-field studies of α-MoO3 have been demonstrated as an effective strategy to accurately extract the permittivity of this material. Here, we use this accurately characterized and low-loss polaritonic material to sense its local dielectric environment, namely silica (SiO2), one of the most widespread substrates in nanotechnology. By studying the propagation of PhPs on α-MoO3 flakes with different thicknesses laying on SiO2 substrates via near-field microscopy (s-SNOM), we extract locally the infrared permittivity of SiO2. Our work reveals PhPs nanoimaging as a versatile method for the quantitative characterization of the local optical properties of dielectric substrates, crucial for understanding and predicting the response of nanomaterials and for the future scalability of integrated nanophotonic devices. View Full-Text
Keywords: s-SNOM; phonon polaritons; van der Waals materials; infrared permittivity s-SNOM; phonon polaritons; van der Waals materials; infrared permittivity
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MDPI and ACS Style

Aguilar-Merino, P.; Álvarez-Pérez, G.; Taboada-Gutiérrez, J.; Duan, J.; Prieto, I.; Álvarez-Prado, L.M.; Nikitin, A.Y.; Martín-Sánchez, J.; Alonso-González, P. Extracting the Infrared Permittivity of SiO2 Substrates Locally by Near-Field Imaging of Phonon Polaritons in a van der Waals Crystal. Nanomaterials 2021, 11, 120. https://0-doi-org.brum.beds.ac.uk/10.3390/nano11010120

AMA Style

Aguilar-Merino P, Álvarez-Pérez G, Taboada-Gutiérrez J, Duan J, Prieto I, Álvarez-Prado LM, Nikitin AY, Martín-Sánchez J, Alonso-González P. Extracting the Infrared Permittivity of SiO2 Substrates Locally by Near-Field Imaging of Phonon Polaritons in a van der Waals Crystal. Nanomaterials. 2021; 11(1):120. https://0-doi-org.brum.beds.ac.uk/10.3390/nano11010120

Chicago/Turabian Style

Aguilar-Merino, Patricia, Gonzalo Álvarez-Pérez, Javier Taboada-Gutiérrez, Jiahua Duan, Iván Prieto, Luis M. Álvarez-Prado, Alexey Y. Nikitin, Javier Martín-Sánchez, and Pablo Alonso-González. 2021. "Extracting the Infrared Permittivity of SiO2 Substrates Locally by Near-Field Imaging of Phonon Polaritons in a van der Waals Crystal" Nanomaterials 11, no. 1: 120. https://0-doi-org.brum.beds.ac.uk/10.3390/nano11010120

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