Recent Progress on Optical Tomographic Technology for Measurements and Inspections of Film Structures
Abstract
:1. Introduction
2. Technology and Analysis in Optical Film Metrology
2.1. Ellipsometry
2.2. Reflectometry
2.3. Confocal Microscopy
2.4. Interferometry
2.5. Hybrid Technique
3. Measurement Scheme
3.1. Temporal Acquisition of the Data
3.2. Spatial Acquisition of the Data
3.3. Snapshot Measurement
4. Discussion
5. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
References
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Ellipsometry | Reflectometry | Confocal Microscopy | Interferometry | Hybrid Technique | |
---|---|---|---|---|---|
Thin film measurement | |||||
Thick film (plate) measurement | |||||
Topographic measurement | |||||
Measurement speed | |||||
Precision | |||||
Research trend | Snapshot measurement | Thin film measurement | Motionless measurement | Theoretical model-based algorithm | Multi-functional measurement |
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Joo, K.-N.; Park, H.-M. Recent Progress on Optical Tomographic Technology for Measurements and Inspections of Film Structures. Micromachines 2022, 13, 1074. https://0-doi-org.brum.beds.ac.uk/10.3390/mi13071074
Joo K-N, Park H-M. Recent Progress on Optical Tomographic Technology for Measurements and Inspections of Film Structures. Micromachines. 2022; 13(7):1074. https://0-doi-org.brum.beds.ac.uk/10.3390/mi13071074
Chicago/Turabian StyleJoo, Ki-Nam, and Hyo-Mi Park. 2022. "Recent Progress on Optical Tomographic Technology for Measurements and Inspections of Film Structures" Micromachines 13, no. 7: 1074. https://0-doi-org.brum.beds.ac.uk/10.3390/mi13071074