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Journal: Electronics, 2021
Volume: 10
Number: 2446

Article: RF Pogo-Pin Probe Card Design Aimed at Automated Millimeter-Wave Multi-Port Integrated-Circuit Testing
Authors: by K. M. Lee, J. H. Oh, M. S. Kim, T. S. Kim and M. Kim
Link: https://0-www-mdpi-com.brum.beds.ac.uk/2079-9292/10/19/2446

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