Using Dielectric Materials in Charged Particle Accelerator Technologies
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Electronic Materials".
Deadline for manuscript submissions: closed (30 November 2021) | Viewed by 244
Special Issue Editor
Special Issue Information
Dear Colleagues,
We are here proposing a Special Issue on “Using Dielectric Materials in Charged Particle Accelerator Technologies” in Materials. Charged particle detection and imaging techniques have a long history of using fluorescence, scintillation or Cherenkov radiation from dielectric materials. However, for many decades, their use in particle beam sources, accelerators and related technologies was limited to a few applications. Today, the situation has considerably evolved, and in this Special Issue, we would like to invite all scholars to contribute your interesting research works in beam instrumentation for charged particle beams and related fields.
The topic should be related, but not limited, to the following topics:
- Dielectric materials used in charged beam particle instrumentation (e.g., Cherenkov radiation, transition and diffraction radiation, fluorescence and scintillation, etc.);
- Cherenkov free-electron maser and laser;
- Beam-induced electro-optical and magneto-optical effects in birefringent dielectric materials and their applications;
- Deflecting charged particle beams in bent crystals;
- New acceleration technologies using dielectric laser and THz acceleration as well as dielectric wakefield acceleration;
- The use of dielectric material and coating as ultra-high vacuum components, e.g., (photo)cathode, radiofrequency/THz windows or beam targets and dumps, etc.
It is our pleasure to invite you to publish your brilliant work in the form of articles, short communications, reviews, as well as technical notes in this Special Issue.
Dr. Thibaut Lefevre
Guest Editor
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Keywords
- dielectric materials
- beam instrumentation
- charged particle beams
- accelerator technologies