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Using Dielectric Materials in Charged Particle Accelerator Technologies

A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Electronic Materials".

Deadline for manuscript submissions: closed (30 November 2021) | Viewed by 244

Special Issue Editor


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Guest Editor
European Organization for Nuclear Research, Esplanade des Particules 1, 1217 Meyrin, Switzerland
Interests: beam instrumentation; optics and lasers plasmonics; acceleration techniques; THz source

Special Issue Information

Dear Colleagues,

We are here proposing a Special Issue on “Using Dielectric Materials in Charged Particle Accelerator Technologies” in Materials. Charged particle detection and imaging techniques have a long history of using fluorescence, scintillation or Cherenkov radiation from dielectric materials. However, for many decades, their use in particle beam sources, accelerators and related technologies was limited to a few applications. Today, the situation has considerably evolved, and in this Special Issue, we would like to invite all scholars to contribute your interesting research works in beam instrumentation for charged particle beams and related fields.

The topic should be related, but not limited, to the following topics:

  • Dielectric materials used in charged beam particle instrumentation (e.g., Cherenkov radiation, transition and diffraction radiation, fluorescence and scintillation, etc.);
  • Cherenkov free-electron maser and laser;
  • Beam-induced electro-optical and magneto-optical effects in birefringent dielectric materials and their applications;
  • Deflecting charged particle beams in bent crystals;
  • New acceleration technologies using dielectric laser and THz acceleration as well as dielectric wakefield acceleration;
  • The use of dielectric material and coating as ultra-high vacuum components, e.g., (photo)cathode, radiofrequency/THz windows or beam targets and dumps, etc.

It is our pleasure to invite you to publish your brilliant work in the form of articles, short communications, reviews, as well as technical notes in this Special Issue.

Dr. Thibaut Lefevre
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • dielectric materials
  • beam instrumentation
  • charged particle beams
  • accelerator technologies

Published Papers

There is no accepted submissions to this special issue at this moment.
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