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Journal: Electronics, 2020
Volume: 9
Number: 1119

Article: Localization of Small Anomalies via the Orthogonality Sampling Method from Scattering Parameters
Authors: by Seongje Chae, Chi Young Ahn and Won-Kwang Park
Link: https://0-www-mdpi-com.brum.beds.ac.uk/2079-9292/9/7/1119

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