Conferences
1–31 October 2021, online
The 2nd International Electronic Conference - Enabling Nanoelectronics
We are pleased to invite you to join the 2nd International Electronic Conference—Enabling Nanoelectronics, which will be held on 1-31 October 2021 at https://sciforum.net/conference/IEC2021
In the past year, we’ve all learned to adjust to a world where we do not necessarily interact with people face-to-face. Instead, we’ve learned to move our interactions online. While this can be a challenge in many ways, it has also led to new ways of doing things. Many scientific conferences have moved online, where people from all over the world can discuss the latest research without ever leaving their home. IEC 2021 aims to focus on four broad areas:
A. Material, Process, Device and Technology
- 3-D Integration
- Device Physics, Materials and Scaling
- Emerging Device Technologies
- IC Assembly and Packaging
- MEMS, MOEMS and NEMS
- Modeling and Characterization
- Nanoelectronics and Spintronics
- Nanoprocessing, Nanotechnology and Nanofabrication
- Reliability and Failure Analysis
- Semiconductor Devices
- Testing and Yield Enhancement
B. Integrated Circuits
- ADC, DAC
- Analog, digital, mixed-signal, power and RF/mm-wave/THz IC
- ASIC
- Fault Tolerant Circuits
- Frequency-to-Digital Converters (FDC)
- IC Sensors
- Low-Power Low-Voltage IC
- Memories
- Microprocessors, Microcontrollers and DSPs
- Nonlinear Circuits
- Optoelectronic
- Switched Capacitor and Current Mode Circuits
- Time-to-Digital Converters (TDC)
- VLSI Arithmetic Circuits
- Voltage-to-Frequency Converters (VFC)
C. Integrated Systems
- Biomedical Systems
- Clock Distribution
- Digital Multimedia IC
- Distributed Computing Architecture
- Embedded Systems
- Power Management
- Reconfigurable Systems
- Sensory Systems
- Soft Computing Systems
- System-in-Package (SiP)
- System-on-Chip (SoC)
- Wireless and RF Communications
D. Design Automation and Verification
- Analog Synthesis
- Area, Power and Thermal Analysis
- Computer-Aided Design (CAD) for ICs
- Floor plan and Layout
- Hardware/Software Co-Design
- Library Development and Design Methodology
- Logic, Architectural and System Synthesis
- Mixed-Mode/Domain Simulation
- Routing and Interconnect
- Signal Integrity/EMC/EMI
- Simulation, Verification and Testability
- SoC, MPSoC, NoC, SIP, and NIP Design and Test
- Testing, Design for Testability, Design for Manufacturing, Built-in Self-test
We hope that you will choose to be a part of this exciting conference and present your most transformative research on electronics.
