Metrology is an international, peer-reviewed, open access journal focused on the science and technology of measurement and metrology, published quarterly online by MDPI.
  • Open Access—free to download, share, and reuse content. Authors receive recognition for their contribution when the paper is reused.
  • Rapid Publication: manuscripts are peer-reviewed and a first decision provided to authors approximately 13.2 days after submission; acceptance to publication is undertaken in 8.8 days (median values for papers published in this journal in the first half of 2021).
  • Recognition of Reviewers: APC discount vouchers, optional signed peer review, and reviewer names published annually in the journal.
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Special Issue in Metrology
Measurement Uncertainty Guest Editor: Simona Salicone
Deadline: 31 August 2021
Special Issue in Metrology
Virtual Measuring Systems and Digital Twins Guest Editors: Sascha Eichstädt, Markus Bär, Karin Kniel
Deadline: 15 December 2021
Special Issue in Metrology
Frequency Metrology Guest Editor: Gianluca Galzerano
Deadline: 20 December 2021
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