Metrology is an international, peer-reviewed, open access journal on the science and technology of measurement and metrology, published quarterly online by MDPI.
  • Open Access— free for readers, with article processing charges (APC) paid by authors or their institutions.
  • Rapid Publication: manuscripts are peer-reviewed and a first decision is provided to authors approximately 28.6 days after submission; acceptance to publication is undertaken in 5.2 days (median values for papers published in this journal in the second half of 2023).
  • Recognition of Reviewers: APC discount vouchers, optional signed peer review, and reviewer names published annually in the journal.
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Topic in Applied Sciences, JMMP, Materials, Metrology, Sensors, Standards
Measurement Strategies and Standardization in Manufacturing Topic Editors: Manuel Rodríguez-Martín, João Ribeiro, Roberto García Martín
Deadline: 20 December 2024
Special Issue in Metrology
Novel Dynamic Measurement Methods and Systems Guest Editors: Lukasz Scislo, Nina Szczepanik-Scislo, Serge Demidenko
Deadline: 30 June 2024
Special Issue in Metrology
Advances in Magnetic Measurements Guest Editor: Nicholas Sammut
Deadline: 5 August 2024
Special Issue in Metrology
Developments in 3D Metrology Selected from the 3D Metrology Conference Guest Editors: Stephen Kyle, Ben Hughes, Stuart Robson, Robert Schmitt
Deadline: 30 November 2024
Special Issue in Metrology
Advances in Optical 3D Metrology Guest Editors: Giorgio Vassena, Fabio Remondino, Mark Shortis
Deadline: 25 June 2025
Topical Collection in Metrology
Measurement Uncertainty Collection Editor: Simona Salicone
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