Strain in III–V Materials and Devices: Methods for Estimation and Effects

Dear Colleagues,

Mechanical strain affects the operation of III–V devices, including lasers and photonic-integrated circuits (PICs), through primarily the photoelastic effect and reliability issues. Thus methods to measure or estimate strain are of importance to provide input for the understanding and optimization of the operation of III–V devices. 

Multiple optical methods to estimate strain in materials exist, including but not limited to the analysis of spectral or polarization resolved measurement of cathodoluminescence, electroluminescence, and photoluminescence; Raman; birefringence; x-ray; and synchrotron. 

The goal of this Special Issue is to collect articles on methods for the estimation of strain in III–V materials and devices, and on the effects of strain on these materials and devices. The intent is to provide, in one issue, information on the performance and limitations of the various methods to estimate strain, to demonstrate the measurement techniques, and to illustrate the effects of strain on III–V devices and materials. Hopefully, this Special Issue will provide a convenient repository from which researchers can evaluate techniques and discover the latest effects of strain on III–V materials and devices. 

Articles on a measurement technique are expected to discuss and demonstrate the limiting performance such as spatial resolution and minimum measurable strain of the technique, and to discuss the advantages and disadvantages of the technique.

Submissions that discuss and demonstrate new methods for the estimation or measurement of strain are encouraged. These new methods could include machine-assisted learning or finite element method (FEM) simulations coupled with optical measurements of some type.  

In addition, submissions that report original measurements of the effects on strain on III–V devices are encouraged. The strain in these original measurements could be caused by die attach, wafter bonding, diffusion, dielectrics, metallization, geometry, or any of the many fabrication steps required to make a device.

Prof. Dr. Daniel T. Cassidy
Guest Editor

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• strain
• III–V materials and devices
• effects of strain
• optical methods
• measurement technique
• optical measurements