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Advanced Instrumentation for Materials Characterisation and Fabrication
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Advanced Instrumentation for Materials Characterisation and Fabrication

A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".

Deadline for manuscript submissions: closed (20 April 2022) | Viewed by 4259

Special Issue Editors

Dr. Elena Taran

E-Mail Website
Guest Editor
Platform Manager, Materials Characterisation and Fabrication Platform (MCFP), University of Melbourne, Melbourne, VIC, Australia
Interests: colloid and interface science; atomic force microscopy and force spectroscopy; raman spectroscopy and imaging; nanomaterials
Special Issues, Collections and Topics in MDPI journals
Dr. Anders Barlow

E-Mail Website
Guest Editor
Materials Characterisation and Fabrication Platform, The University of Melbourne, Melbourne, VIC 3010, Australia
Interests: surface chemical analysis; surface physics; ion–surface interactions; nanomaterials; helium ion microscopy; Raman spectroscopy and imaging; X-ray analysis
Special Issues, Collections and Topics in MDPI journals
Dr. Tian Zheng

E-Mail Website
Guest Editor
Platform Technologies Specialist, Materials Characterisation and Fabrication Platform (MCFP), University of Melbourne, Melbourne, VIC, Australia
Interests: atomic force microscopy; force spectroscopy; nanomaterials; colloid and interface science; soft materials; nanoindentation analysis

Special Issue Information

Dear Colleagues,

The intimate connection between high-performance fabrication and characterisation catalyses and accelerates the development of emerging fields, such as micro-nano-electromechanical systems, photonics, and micro/nanofluidics, just to name a few. Integrating multiple functionality in a single instrument, such as in the case of atomic force microscopes or helium ion microscopes, capable of performing, on the same platform, imaging and nano-lithography, brings a plethora of advantages for both research scientists and industry. Among these, rapid prototyping, real time monitoring, and quality assessment stand out.

In this Special Issue, we are inviting you to submit reviews and original manuscripts highlighting latest advancements in the fabrication and characterisation of new materials/devices/design under the umbrella of advanced instrumentation.

Dr. Elena Taran
Dr. Anders Barlow
Dr. Tian Zheng
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • materials characterisation
  • fabrication
  • nanomaterials
  • surface chemical analysis

Published Papers (2 papers)

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Research

11 pages, 2913 KiB  
Article
Real-Space Image of Charged Patches in Tunable-Size Nanocrystals
by Jordi Martínez-Esaín, Ana Pérez-Rodríguez, Jordi Faraudo, Esther Barrena, Ramón Yáñez, Carmen Ocal and Susagna Ricart
Materials 2022, 15(4), 1455; https://0-doi-org.brum.beds.ac.uk/10.3390/ma15041455 - 15 Feb 2022
Viewed by 1802
Abstract
The remarkable dual nature of faceted-charge patchy metal fluoride nanocrystals arises from the spontaneous selective coordination of anionic and cationic ligands on the different facets of the nanocrystals. In previous studies, the identification and origin of the charge at the patches were obtained [...] Read more.
The remarkable dual nature of faceted-charge patchy metal fluoride nanocrystals arises from the spontaneous selective coordination of anionic and cationic ligands on the different facets of the nanocrystals. In previous studies, the identification and origin of the charge at the patches were obtained by combining computer simulations with indirect experimental evidence. Taking a step further, we report herein the first direct real-space identification by Kelvin probe force microscopy of the predicted faceted-charge patchy behavior, allowing the image of the dual faceted-charge surfaces. High-resolution transmission electron microscopy reveals the detailed nanocrystal faceting and allows unambiguously inferring the hydrophilic or hydrophobic role of each facet from the identification of the surface atoms exposed at the respective crystallographic planes. The success of the study lies in a foresighted synthesis methodology designed to tune the nanocrystal size to be suitable for microscopy studies and demanding applications. Full article
(This article belongs to the Special Issue Advanced Instrumentation for Materials Characterisation and Fabrication)
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14 pages, 2436 KiB  
Article
Diffraction of a Gaussian Beam with Limited cross Section by a Volume Phase Grating under Waveguide Mode Resonance
by Volodymyr Fitio, Iryna Yaremchuk, Andriy Bendziak, Michal Marchewka and Yaroslav Bobitski
Materials 2021, 14(9), 2252; https://0-doi-org.brum.beds.ac.uk/10.3390/ma14092252 - 27 Apr 2021
Cited by 2 | Viewed by 1626
Abstract
In this work, the diffraction of a Gaussian beam on a volume phase grating was researched theoretically and numerically. The proposed method is based on rigorous coupled-wave analysis (RCWA) and Fourier transform. The Gaussian beam is decomposed into plane waves using the Fourier [...] Read more.
In this work, the diffraction of a Gaussian beam on a volume phase grating was researched theoretically and numerically. The proposed method is based on rigorous coupled-wave analysis (RCWA) and Fourier transform. The Gaussian beam is decomposed into plane waves using the Fourier transform. The number of plane waves is determined using the sampling theorem. The complex reflected and transmitted amplitudes are calculated for each RCWA plane wave. The distribution of the fields along the grating for the reflected and transmitted waves is determined using inverse Fourier transform. The powers of the reflected and transmitted waves are determined based on these distributions. Our method shows that the energy conservation law is satisfied for the phase grating. That is, the power of the incident Gaussian beam is equal to the sum of the powers of the reflected and transmitted beams. It is demonstration of our approach correctness. The numerous studies have shown that the spatial shapes of the reflected and transmitted beams differ from the Gaussian beam under resonance. In additional, the waveguide mode appears also in the grating. The spatial forms of the reflected and transmitted beams are Gaussian in the absence of resonance. It was found that the width of the resonance curves is wider for the Gaussian beam than for the plane wave. However, the spectral and angular sensitivities are the same as for the plane wave. The resonant wavelengths are slightly different for the plane wave and the Gaussian beam. Numerical calculations for four refractive index modulation coefficients of the grating medium were carried out by the proposed method. The widths of the resonance curves decrease with the increasing in the refractive index modulation. Moreover, the reflection coefficient also increases. Full article
(This article belongs to the Special Issue Advanced Instrumentation for Materials Characterisation and Fabrication)
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