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Editorial Board Members’ Collection Series: Wavefront Sensing

A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Optical Sensors".

Deadline for manuscript submissions: closed (15 February 2024) | Viewed by 1818

Special Issue Editors


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Guest Editor
Institute of Photonics and Electronics, Department of Precision Instruments, Tsinghua University, Beijing 100084, China
Interests: adaptive optics; wavefront sensor; instrumentation; adaptive interferometric metrology; optical system design; application technologies
Special Issues, Collections and Topics in MDPI journals

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Guest Editor
XXL—The Extreme Optoelectromechanics Laboratory, School of Physics and Electronic Science, East China Normal University, Shanghai 200241, China
Interests: ultrafast nonlinear optics and its related applications; biophotonics; fundamental research on interactions of ultrafast laser pulses with matter and applications in the areas of remote sensing and laser micro and nano processing

Special Issue Information

Dear Colleagues,

This Special Issue is focused on advanced optical wavefront sensing for various optical systems, including the development of wavefront/non-wavefront sensing technology (e.g., sensing, reconstruction, algorithms, deep learning), wavefront-sensing-based technology (e.g., beam quality improvement, computational imaging), and device technology (e.g., meta-surface, sensors). Our scope includes all the challenges in the research and industrial fields, from microscopy optics to large-scale telescope optics.

Prof. Dr. Lei Huang
Prof. Dr. Ya Cheng
Guest Editors

Manuscript Submission Information

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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • wavefront sensing
  • wavefront reconstruction
  • wavefront distribution
  • wavefront sensor
  • wavefront corrector

Published Papers (2 papers)

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Research

13 pages, 8071 KiB  
Article
Exploring Wavefront Detection in Imaging Systems with Rectangular Apertures Using Phase Diversity
by Yibo Li, Jiang Guo and Rengcong Liu
Sensors 2024, 24(4), 1191; https://0-doi-org.brum.beds.ac.uk/10.3390/s24041191 - 11 Feb 2024
Viewed by 572
Abstract
The attainment of a substantial aperture in the rotating synthetic aperture imaging system involves the rotation of a slender rectangular primary mirror. This constitutes a pivotal avenue of exploration in space telescope research. Due to the considerable aspect ratio of the primary mirror, [...] Read more.
The attainment of a substantial aperture in the rotating synthetic aperture imaging system involves the rotation of a slender rectangular primary mirror. This constitutes a pivotal avenue of exploration in space telescope research. Due to the considerable aspect ratio of the primary mirror, environmental disturbances can significantly impact its surface shape. Active optical technology can rectify surface shape irregularities through the detection of wavefront information. The Phase Diversity (PD) method utilizes images captured by the imaging system to compute wavefront information. In this study, the PD method is applied to rotating synthetic and other rectangular aperture imaging systems, employing Legendre polynomials to model the wavefront. The study delved into the ramifications stemming from the aperture aspect ratio and aberration size. Full article
(This article belongs to the Special Issue Editorial Board Members’ Collection Series: Wavefront Sensing)
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14 pages, 2708 KiB  
Article
Adaptive Petal Reflector: In-Lab Software Configurable Optical Testing System Metrology and Modal Wavefront Reconstruction
by Carl Johan G. Nielsen and André Preumont
Sensors 2023, 23(17), 7316; https://0-doi-org.brum.beds.ac.uk/10.3390/s23177316 - 22 Aug 2023
Cited by 1 | Viewed by 742
Abstract
This paper addresses two aspects of the metrology of spherical, petal polymer reflectors which are part of an effort by the European Space Agency (ESA) to develop actively controlled foldable reflectors, enabling larger apertures on CubeSats and small satellites. The first problem is [...] Read more.
This paper addresses two aspects of the metrology of spherical, petal polymer reflectors which are part of an effort by the European Space Agency (ESA) to develop actively controlled foldable reflectors, enabling larger apertures on CubeSats and small satellites. The first problem is that of measuring the surface figure error of the spherical reflector alone during the development phase, and to assess the quality before assembling the telescope (large stroke, low accuracy). The SCOTS (Software Configurable Optical Testing System) appears to provide a fast and satisfactory solution to this problem. The second problem is the wavefront error reconstruction when the petal reflector is mounted on the telescope, because parts of the petals are obscured by the secondary mirror, in such a way that the petals appear completely disconnected, making the gradient-based metrology impossible. Using the fact that the petals have common mechanical boundary conditions at the central support ring, the problem is solved by using a set of orthogonal modes satisfying the same boundary conditions. The vibration modes are used for this purpose; the modal amplitudes are reconstructed from slope data outside the obstruction, allowing for wavefront error reconstruction over the entire surface. Full article
(This article belongs to the Special Issue Editorial Board Members’ Collection Series: Wavefront Sensing)
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