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Article

Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials

1
Faculty of Education, Niigata University, Niigata 950-2181, Japan
2
National Institutes for Quantum and Radiological Science and Technology, Sayo-gun, Hyogo 679-5148, Japan
3
Japan Synchrotron Radiation Research Institute, Sayo-gun, Hyogo 679-5198, Japan
4
Japan Atomic Energy Agency, Sayo-gun, Hyogo 679-5148, Japan
*
Author to whom correspondence should be addressed.
Quantum Beam Sci. 2020, 4(3), 25; https://0-doi-org.brum.beds.ac.uk/10.3390/qubs4030025
Received: 20 April 2020 / Revised: 29 June 2020 / Accepted: 7 July 2020 / Published: 9 July 2020
(This article belongs to the Special Issue Analysis of Strain, Stress and Texture with Quantum Beams)
Stress measurements of coarse-grained material are difficult using synchrotron X-ray diffraction because the diffraction patterns of coarse-grained materials are spotty. In addition, the center of the diffraction pattern is unknown for the transmitted X-ray beam. Here, a double-exposure method is proposed as the countermeasure against this issue. In the experiment, we introduce a CdTe pixel detector. The detector is a newly developed area detector and can resolve high-energy X-rays. The strains of the coarse-grained material can be measured using a combination of the double-exposure method, white synchrotron X-ray, and the CdTe pixel detector. The bending stress in an austenitic stainless steel plate was measured using the proposed technique. As a result, the measured stress corresponded to the applied bending stress. View Full-Text
Keywords: synchrotron white X-ray; double-exposure method; CdTe pixel detector; coarse grain; X-ray stress measurement; austenitic stainless steel synchrotron white X-ray; double-exposure method; CdTe pixel detector; coarse grain; X-ray stress measurement; austenitic stainless steel
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MDPI and ACS Style

Suzuki, K.; Shiro, A.; Toyokawa, H.; Saji, C.; Shobu, T. Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials. Quantum Beam Sci. 2020, 4, 25. https://0-doi-org.brum.beds.ac.uk/10.3390/qubs4030025

AMA Style

Suzuki K, Shiro A, Toyokawa H, Saji C, Shobu T. Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials. Quantum Beam Science. 2020; 4(3):25. https://0-doi-org.brum.beds.ac.uk/10.3390/qubs4030025

Chicago/Turabian Style

Suzuki, Kenji, Ayumi Shiro, Hidenori Toyokawa, Choji Saji, and Takahisa Shobu. 2020. "Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials" Quantum Beam Science 4, no. 3: 25. https://0-doi-org.brum.beds.ac.uk/10.3390/qubs4030025

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